Combining controlled-release urea and normal urea with appropriate nitrogen application rate to reduce wheat stem lodging risk and increase grain yield and yield stability
ZHANG Guang-xin, ZHAO De-hao, FAN Heng-zhi, LIU Shi-ju, LIAO Yun-cheng, HAN Juan
Combining controlled-release urea and normal urea with appropriate nitrogen application rate to reduce wheat stem lodging risk and increase grain yield and yield stability
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