Study on resistance evaluation of spot blotch caused by H. sativum with detached leaves in wheat

Song Qingjie

Chinese Agricultural Science Bulletin ›› 2005, Vol. 21 ›› Issue (8) : 352-352. DOI: 10.11924/j.issn.1000-6850.0508352
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Study on resistance evaluation of spot blotch caused by H. sativum with detached leaves in wheat

  • Song Qingjie
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Abstract

We studied feasibility of wheat breeding for resistance to spot blotch caused by H. sativum using detached leaves method, the results showed that using the evaluation method of detached leaves has some advantage including nicety, fast and no influence of environments. With this method, we evaluated 2632 lines and screened 8 lines with high resistance and 60 lines with medium resistance to spot blotch. Among the resistant lines,17 are synthetic hexaploid wheat and 51 lines are common wheat.

Key words

Wheat;Spot blotch;Evaluation with detached leaves;Screening of resistance resource

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Song Qingjie. Study on resistance evaluation of spot blotch caused by H. sativum with detached leaves in wheat. Chinese Agricultural Science Bulletin. 2005, 21(8): 352-352 https://doi.org/10.11924/j.issn.1000-6850.0508352

References

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