Genetic Dissection of Flag Leaf Related Traits and Grain Yield per Plant Using Genome-wide Association Analysis

ZHU Shuang-bing,LV Wen-kai,HE Li-ping,XING Dan-ying,YANG Long-wei,QIU Xian-jin and XU Jian-long

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Journal of Plant Genetic Resources ›› 2020, Vol. 21 ›› Issue (3) : 663-673. DOI: 10.13430/j.cnki.jpgr.20191230002
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Genetic Dissection of Flag Leaf Related Traits and Grain Yield per Plant Using Genome-wide Association Analysis

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