Genetic Dissection of Flag Leaf Related Traits and Grain Yield per Plant Using Genome-wide Association Analysis
ZHU Shuang-bing,LV Wen-kai,HE Li-ping,XING Dan-ying,YANG Long-wei,QIU Xian-jin and XU Jian-long
Genetic Dissection of Flag Leaf Related Traits and Grain Yield per Plant Using Genome-wide Association Analysis
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