QTL Mapping for Grain Yield Associated Traits Using Ye 478 Introgression Lines in Maize

ZHAOPu, LIURui-Xiang, LICheng-Pu, XINGXiang-Ru, CAOXiao-Liang, TAOYong-Sheng, ZHANGZu-Xin

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Scientia Agricultura Sinica ›› 2011, Vol. 44 ›› Issue (17) : 3508-3519. DOI: 10.3864/j.issn.0578-1752.2011.17.003
CROP GENETICS & BREEDING·GERMPLASM RESOURCES·MOLECULAR GENETICS

QTL Mapping for Grain Yield Associated Traits Using Ye 478 Introgression Lines in Maize

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2011, 44(17): 3508-3519 https://doi.org/10.3864/j.issn.0578-1752.2011.17.003

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